Characterization of Void-Dominated Ductile Failure in Pure Ta

Mechanistic descriptions of void-dominated ductile failure are largely based on studies from several decades ago that relied on optical microscopy techniques [1] [2]. This talk will discuss how modern techniques, such as scanning electron microscopy (SEM), electron backscattered diffraction (EBSD), site-specific focused ion beam (FIB) sample preparation, and transmission electron microscopy (TEM), can enable new insight into the ductile failure process, particularly at the nano to microscale. Because this work is part of a collaborative effort to develop predictive computational models for failure of BCC metals, experiments are focused on characterizing the void-dominated ductile failure process in pure Ta.